Browsing by Author Negri, R.
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Issue Date | Title | Author(s) | Fulltext |
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2010 | Reflectivity and stress characterization of W/Si and Pt/C multilayer samples for the New Hard X-ray Mission phase B development | SPIGA, Daniele ; Raimondi, L.; SALMASO, Bianca ; Negri, R. | none |
Showing results 3 to 3 of 3
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