Browsing by Author Destefanis, G.
Showing results 1 to 3 of 3
Issue Date | Title | Author(s) | Fulltext |
---|---|---|---|
2007 | Results of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfA | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Budau, B.; Burkert, W.; Colombo, D.; Destefanis, G.; Freyberg, M., et al | none |
2008 | Silicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterization | SPIGA, Daniele ; SIRONI, GIORGIA ; COTRONEO, VINCENZO ; CANESTRARI, Rodolfo ; Destefanis, G. | none |
2007 | Surface roughness and bulk characterization of SiC and Aluminium samples with PECVD-SiC cladding | CANESTRARI, Rodolfo ; SPIGA, Daniele ; PARESCHI, Giovanni ; Ghigo, Mauri; Arumainathan, S.; Destefanis, G.; Fabbri, P.; Ferrari, C.; Guaita, C.; Nicolosi, P., et al | none |
Showing results 1 to 3 of 3
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