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  1. OA@INAF
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Browsing by Author Negri, R.


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Issue DateTitleAuthor(s)Fulltext
2011Hard X-ray mirrors for NHXM: reflectivity and roughness characterization of mirror shell samplesSALMASO, Bianca ; Raimondi, L.; Negri, R.; SPIGA, Daniele ; Binda, R.; Orlandi, A.; Valsecchi, Giuseppenone
2013Profile and roughness metrology of slumped glasses for the "IXO back-up optics" projectSPIGA, Daniele ; Proserpio, Laura; SALMASO, Bianca ; GHIGO, Mauro ; Friedrich, P.; Vongehr, M.; Winter, A.; BASSO, Stefano ; CIVITANI, Marta Maria ; Gallieni, D., et alnone
2010Reflectivity and stress characterization of W/Si and Pt/C multilayer samples for the New Hard X-ray Mission phase B developmentSPIGA, Daniele ; Raimondi, L.; SALMASO, Bianca ; Negri, R.none
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