Publications
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Results 1-20 of 126 (Search time: 0.01 seconds).

Issue DateTitleAuthor(s)Fulltext
120162D diffraction simulations of a 12 m focal length SPO mirror module for ATHENASPIGA, Daniele ; Valsecchi, Giuseppe; Marioni, F.; Bianucci, G.; Bavdaz, M.; Wille, E.none
22015Acceptance tests and calibration of the Explorer Atomic Force Microscope new headSALMASO, Bianca ; SPIGA, Daniele none
32016Acceptance tests for the MicroFinish TopographerTayabaly, K.; Rossi, Massimiliano; Scaccabarozzi, L.; SPIGA, Daniele none
42012AFM analysis of test wafers coated with Cr-Ni-Au layers: roughness characterizationSALMASO, Bianca ; SPIGA, Daniele none
52017BEaTriX X-ray facility for testing ATHENA mirror modules: a white paper for the implementationSPIGA, Daniele ; PARESCHI, Giovanni ; SALMASO, Bianca ; TAGLIAFERRI, Gianpiero none
62018BEaTriX: vibrations campaign on the laboratory groundSALMASO, Bianca ; SPIGA, Daniele ; BASSO, Stefano ; GIRO, Enrico ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero none
72008Calibration of SIMBOL-X optics at PANTER facility: proposed setup and hardware implementationSPIGA, Daniele ; BASSO, Stefano ; PARESCHI, Giovanni ; Malaguti, P.; Freyberg, M.; Briel, U.none
82009Calibration of very long (>10 m) focal length X-ray optics at PANTER facility: a short updateSPIGA, Daniele none
92009Calibration of W/Si multilayer samples for SIMBOL-X X-ray telescope Phase A developmentSPIGA, Daniele ; PROSERPIO, Laura; CIVITANI, Marta Maria ; Dell’Orto, E.; SIRONI, GIORGIA ; COTRONEO, VINCENZO ; Mattarello, V.; Garoli, D.; Boscolo Marchi, E.none
102006Characterization of a PECVD-SiC replicated mirror sampleCANESTRARI, Rodolfo ; VALTOLINA, RENZO; SPIGA, Daniele ; PARESCHI, Giovanni none
112005Characterization of a W/Si graded multilayer coated mirror shell (n. 326) preformed by Nickel electroforming (april 2004)SPIGA, Daniele none
122006Characterization of an antenna for RFID systemsCANESTRARI, Rodolfo ; PARESCHI, Giovanni none
132005Characterization of Pt/C and W/Si multilayer-coated mirror shells at the PANTER facility (Sep 2004 - Feb 2005)SPIGA, Daniele none
142011Characterization of slumped glasses for the IXO backup optics project, phase 2SPIGA, Daniele ; PROSERPIO, Laura; Pagano, Giuseppe; SALMASO, Bianca none
152015Characterization of the profiles of slumped glass foils after cutting and annealingHOLYSZKO, JOANNA; SALMASO, Bianca ; CIVITANI, Marta Maria none
162014Characterization of the Silicon cylindrical slumping mould polished by HELLMASALMASO, Bianca ; Brizzolari, C.; CIVITANI, Marta Maria ; SPIGA, Daniele none
172014Characterization of the Zerodur K20-20 cylindrical slumping mould polished by HELLMASALMASO, Bianca ; Brizzolari, C.; SPIGA, Daniele ; Rossi, Massimiliano; Arcangeli, L.none
182015Characterization of the Zerodur K20-20B cylindrical slumping mould polished by HELLMASALMASO, Bianca ; Brizzolari, C.; Arcangeli, L.; Rossi, Massimiliano; SPIGA, Daniele none
192014Characterization Universal Profilometer (CUP): carriages systematic error removalCIVITANI, Marta Maria ; GHIGO, Mauro none
202014Characterization Universal Profilometer (CUP): NewPort carriage characterizationCIVITANI, Marta Maria ; GHIGO, Mauro none