PARESCHI, Giovanni
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Results 1-2 of 2 (Search time: 0.006 seconds).
Issue Date | Title | Author(s) | Fulltext | |
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1 | 2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
2 | 2005 | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | SPIGA, Daniele ; Burkert, W.; Hartner, G.; Budau, B.; Vernani, D.; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco; VALTOLINA, RENZO | none |
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