TAGLIAFERRI, Gianpiero
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Issue Date | Title | Author(s) | Fulltext | |
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1 | 2013 | Profile and roughness metrology of slumped glasses for the "IXO back-up optics" project | SPIGA, Daniele ; PROSERPIO, Laura; SALMASO, Bianca ; GHIGO, Mauro ; Friedrich, P.; Vongehr, M.; Winter, A.; BASSO, Stefano ; CIVITANI, Marta Maria ; Gallieni, D.; Tintori, M.; SIRONI, GIORGIA ; Pagano, G.; Negri, R.; Rossi, Massimiliano; Alpini, A.; Cavenaghi, T.; Zambra, A.; Ferrario, I.; PARESCHI, Giovanni ; Citterio, Oberto; TAGLIAFERRI, Gianpiero | none |
2 | 2010 | X-ray tests at PANTER on the TDM1 optic prototype for the New Hard X-ray Mission | SPIGA, Daniele ; Raimondi, L.; Valsecchi, Giuseppe; Orlandi, A.; Borghi, G.; Salmaso, G.; Marchi, E. B.; Binda, R.; BASSO, Stefano ; Marioni, F.; Ferretti, L.; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; SIRONI, GIORGIA ; Missaglia, N.; TAGLIAFERRI, Gianpiero ; PARESCHI, Giovanni | none |
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