TAGLIAFERRI, Gianpiero
Series
Results 1-2 of 2 (Search time: 0.006 seconds).
Issue Date | Title | Author(s) | Fulltext | |
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1 | 2014 | Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization | Tayabaly, K.; SPIGA, Daniele ; SALMASO, Bianca ; Valsecchi, Giuseppe; Banham, R.; Missaglia, N.; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
2 | 2010 | X-ray tests at PANTER on the TDM2 optic prototype for the New Hard X-ray Mission | SPIGA, Daniele ; Raimondi, L.; SALMASO, Bianca ; Valsecchi, Giuseppe; Orlandi, A.; Borghi, G.; Binda, R.; BASSO, Stefano ; Borrelli, D.; Marioni, F.; Ferretti, L.; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; TAGLIAFERRI, Gianpiero ; PARESCHI, Giovanni | none |
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