BASSO, Stefano
Results 1-20 of 42 (Search time: 0.01 seconds).
Issue Date | Title | Author(s) | Fulltext | |
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1 | 2018 | BEaTriX: vibrations campaign on the laboratory ground | SALMASO, Bianca ; SPIGA, Daniele ; BASSO, Stefano ; GIRO, Enrico ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
2 | 2008 | Calibration of SIMBOL-X optics at PANTER facility: proposed setup and hardware implementation | SPIGA, Daniele ; BASSO, Stefano ; PARESCHI, Giovanni ; Malaguti, P.; Freyberg, M.; Briel, U. | none |
3 | 2008 | Design of mandrels with internal shaf | BASSO, Stefano | none |
4 | 2015 | Evaluation of shape deformations induced by the coating on small cylindrical AF32 samples | CIVITANI, Marta Maria ; BASSO, Stefano ; PARESCHI, Giovanni | none |
5 | 2013 | Extending the INAF/OAB Ultraviolet Vertical Optical Bench to a 20 m focal length | SPIGA, Daniele ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Ferrario, I. | none |
6 | 2015 | Flat Proof of Concept: manufacturing and characterization | CIVITANI, Marta Maria ; BASSO, Stefano ; PARESCHI, Giovanni ; Tintori, M.; Fumi, P. | none |
7 | 2017 | Fused Silica thin segments for X-ray telescopes: status of the process at OAB | SALMASO, Bianca ; BASSO, Stefano ; CIVITANI, Marta Maria ; GHIGO, Mauro ; PARIANI, Giorgio ; SPIGA, Daniele ; VECCHI, Gabriele ; Arcangeli, L.; Ritucci, A.; Rossi, Massimiliano; PARESCHI, Giovanni | none |
8 | 2008 | Geometrical tolerances for the mandrels design | BASSO, Stefano | none |
9 | 2011 | High-resolution X-ray scattering measurement of slumped glasses | SPIGA, Daniele ; Raimondi, L.; SALMASO, Bianca ; CIVITANI, Marta Maria ; Pagano, G.; BASSO, Stefano ; GHIGO, Mauro ; PROSERPIO, Laura | none |
10 | 2006 | Influenza dei gradienti di temperatura su una lastra di vetro | BASSO, Stefano ; PARESCHI, Giovanni | none |
11 | 2008 | Integration for NHXM prototypes in Phase A in OAB vertical bench | BASSO, Stefano | none |
12 | 2006 | Integrazione di shell sottili presso la torrre di misura UV (OAB) utilizzando il case realizzato nel 2004 | BASSO, Stefano | none |
13 | 2012 | IXO back-up optics with slumped glasses: Proof of Concept (PoC) tests at PANTER and INAF/OAB | SPIGA, Daniele ; SALMASO, Bianca ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; SIRONI, GIORGIA ; Pagano, G.; Zambra, A.; Burwitz, Vadim | none |
14 | 2012 | IXO back-up optics with slumped glasses: XOU-BB tests at PANTER and INAF/OAB | SPIGA, Daniele ; CIVITANI, Marta Maria ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; SALMASO, Bianca ; PARESCHI, Giovanni ; Zambra, A.; Pagano, G.; Burwitz, Vadim; Menz, B.; Hartner, G.; Budau, B.; Friedrich, P.; Winter, A. | none |
15 | 2013 | IXO backup optics with slumped glasses: PANTER test of the Proof of Concept #2 optic | SPIGA, Daniele ; CIVITANI, Marta Maria ; PROSERPIO, Laura; SALMASO, Bianca ; BASSO, Stefano ; Burwitz, Vadim; Menz, B.; Hartner, G.; Budau, B. | none |
16 | 2011 | IXO slumped glasses D5 and D7: analysis of spatial wavelength impact on the Point Spread Function by means of the Fresnel diffraction | Raimondi, L.; SPIGA, Daniele ; SALMASO, Bianca ; CIVITANI, Marta Maria ; Pagano, G.; BASSO, Stefano ; GHIGO, Mauro ; PROSERPIO, Laura | none |
17 | 2013 | LTP profiles of AF32 glasses with FEA correction: a method to remove spurious mid-frequency errors | SALMASO, Bianca ; BASSO, Stefano ; SPIGA, Daniele | none |
18 | 2015 | Mirror module design for BICE X-ray telescopes | SPIGA, Daniele ; BASSO, Stefano ; Citterio, Oberto; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Bianucci, G.; Valsecchi, Giuseppe | none |
19 | 2006 | Mirror shell 338 (Jet-X mandrel n.1 sized shell):Achieved tests at Panter facility and INAF/OAB | SPIGA, Daniele ; CANESTRARI, Rodolfo ; Vernani, D.; Freyberg, M.; Bukert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco | none |
20 | 2018 | New input for the assessment of the BEaTriX design | SALMASO, Bianca ; SPIGA, Daniele ; BASSO, Stefano ; Pelliciari, Carlo; GIRO, Enrico ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
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