Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/2089| Title: | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | Authors: | SPIGA, Daniele Burkert, W. Hartner, G. Budau, B. Vernani, D. CANESTRARI, Rodolfo PARESCHI, Giovanni Citterio, Oberto BASSO, Stefano Mazzoleni, Francesco VALTOLINA, RENZO |
Issue Date: | 2005 | Series: | OAB Technical Reports | Number: | 08/2005 | URI: | http://hdl.handle.net/20.500.12386/2089 | Fulltext: | none |
| Appears in Collections: | 4.02 Rapporti tecnici pregressi |
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