Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/2089
DC Field | Value | Language |
---|---|---|
dc.contributor.author | SPIGA, Daniele | - |
dc.contributor.author | Burkert, W. | - |
dc.contributor.author | Hartner, G. | - |
dc.contributor.author | Budau, B. | - |
dc.contributor.author | Vernani, D. | - |
dc.contributor.author | CANESTRARI, Rodolfo | - |
dc.contributor.author | PARESCHI, Giovanni | - |
dc.contributor.author | Citterio, Oberto | - |
dc.contributor.author | BASSO, Stefano | - |
dc.contributor.author | Mazzoleni, Francesco | - |
dc.contributor.author | VALTOLINA, RENZO | - |
dc.date.accessioned | 2019-04-15T13:01:10Z | - |
dc.date.available | 2019-04-15T13:01:10Z | - |
dc.date.issued | 2005 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.12386/2089 | - |
dc.language.iso | eng | - |
dc.publisher | O.A. Brera | - |
dc.title | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | - |
dc.type | Technical report | - |
dc.relation.medium | Elettronico | - |
dc.relation.volume | 08/2005 | - |
dc.type.referee | REF_0 | - |
dc.type.miur | 298 Altro | - |
dc.relation.series | OAB Technical Reports | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.fulltext | No Fulltext | - |
item.languageiso639-1 | en | - |
item.openairetype | Technical report | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | O.A. Brera | - |
crisitem.author.dept | IASF Palermo | - |
crisitem.author.dept | O.A. Brera | - |
crisitem.author.dept | O.A. Brera | - |
crisitem.author.orcid | 0000-0003-1163-7843 | - |
crisitem.author.orcid | 0000-0003-4591-7763 | - |
crisitem.author.orcid | 0000-0003-3967-403X | - |
crisitem.author.orcid | 0000-0002-2342-5090 | - |
Appears in Collections: | 4.02 Rapporti tecnici pregressi |
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