Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/2103
Title: | Silicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterization | Authors: | SPIGA, Daniele SIRONI, GIORGIA COTRONEO, VINCENZO CANESTRARI, Rodolfo Destefanis, G. |
Issue Date: | 2008 | Series: | OAB Technical Reports | Number: | 01/2008 | URI: | http://hdl.handle.net/20.500.12386/2103 | Fulltext: | none |
Appears in Collections: | 4.02 Rapporti tecnici pregressi |
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