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http://hdl.handle.net/20.500.12386/23377
Title: | Computation and validation of two-dimensional PSF simulation based on physical optics | Authors: | Tayabaly, K. SPIGA, Daniele SIRONI, GIORGIA CANESTRARI, Rodolfo Lavagna, M. PARESCHI, Giovanni |
Issue Date: | 2015 | Volume: | Optical Modeling and Performance Predictions VII | Editors: | Kahan, Mark A.; Levine-West, Marie B. | Series: | PROCEEDINGS OF SPIE | Number: | 9577 | First Page: | 957709 | Abstract: | The Point Spread Function (PSF) is a key figure of merit for specifying the angular resolution of optical systems and, as the demand for higher and higher angular resolution increases, the problem of surface finishing must be taken seriously even in optical telescopes. From the optical design of the instrument, reliable ray-tracing routines allow computing and display of the PSF based on geometrical optics. However, such an approach does not directly account for the scattering caused by surface micro-roughness, which is interferential in nature. Although the scattering effect can be separately modeled, its inclusion in the ray-tracing routine requires assumptions that are difficult to verify. In that context, a purely physical optics approach is more appropriate as it remains valid regardless of the shape and size of the defects appearing on the optical surface. Such a computation, when performed in two-dimensional consideration, is memory and time consuming because it requires one to process a surface map with a few micron resolution, and the situation becomes even more complicated in case of optical systems characterized by more than one reflection. Fortunately, the computation is significantly simplified in far-field configuration, since the computation involves only a sequence of Fourier Transforms. In this paper, we provide validation of the PSF simulation with Physical Optics approach through comparison with real PSF measurement data in the case of ASTRI-SST M1 hexagonal segments. These results represent a first foundation stone for future development in a more advanced computation taking into account micro-roughness and multiple reflection in optical systems. | Conference Name: | SPIE Optical Engineering + Applications, 2015 | Conference Place: | San Diego, CA, USA | Conference Date: | 9-13 August, 2015 | URI: | http://hdl.handle.net/20.500.12386/23377 | URL: | https://doi.org/10.1117/12.2187534 | ISSN: | 0277-786X | ISBN: | 9781628417432 | DOI: | 10.1117/12.2187534 | Bibcode ADS: | 2015SPIE.9577E..09T | Fulltext: | open |
Appears in Collections: | 3.01 Contributi in Atti di convegno |
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