Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/24458
DC Field | Value | Language |
---|---|---|
dc.contributor.author | SIRONI, GIORGIA | en_US |
dc.contributor.author | CANESTRARI, Rodolfo | en_US |
dc.contributor.author | Tayabaly, Kashmira | en_US |
dc.contributor.author | PARESCHI, Giovanni | en_US |
dc.date.accessioned | 2020-05-04T15:46:56Z | - |
dc.date.available | 2020-05-04T15:46:56Z | - |
dc.date.issued | 2016 | en_US |
dc.identifier.isbn | 9781510602038 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/20.500.12386/24458 | - |
dc.description.abstract | A deflectometrical facility was developed at Italian National Institute for Astrophysics-OAB to characterize free-form optics with shape errors within few microns rms. Deflectometry is an interesting technique because it allows the fast characterization of free-form optics. The capabilities of deflectometry in measuring medium-high frequencies are well known, but the low frequencies error characterization is more challenging. Our facility design foresees an innovative approach based on the acquisition of multiple direct images to enhance the performance on the challenging low frequencies range. This contribution presents the error-budget analysis of the measuring method and a study of the configuration tolerances required to allow the use of deflectometry in the realization of optical components suitable for astronomical projects with a requirement of high accuracy for the optics. As test examples we took into account mirrors for the E-ELT telescope. | en_US |
dc.language.iso | eng | en_US |
dc.title | Evaluation of novel approach to deflectometry for high accuracy optics | en_US |
dc.type | Conference paper | - |
dc.identifier.doi | 10.1117/12.2233328 | en_US |
dc.identifier.scopus | 2-s2.0-84996606555 | en_US |
dc.identifier.isi | 000387747900034 | en_US |
dc.identifier.url | https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9912/1/Evaluation-of-novel-approach-to-deflectometry-for-high-accuracy-optics/10.1117/12.2233328.short | en_US |
dc.relation.medium | STAMPA | en_US |
dc.relation.volume | 9912 | en_US |
dc.relation.firstpage | 991213 | en_US |
dc.type.referee | REF_0 | en_US |
dc.description.international | sì | en_US |
dc.contributor.country | ITA | en_US |
dc.relation.alleditors | Navarro, Ramón; Burge, James H. | en_US |
dc.relation.ispartofbook | Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II | en_US |
dc.publisher.name | SPIE | en_US |
dc.publisher.place | Bellingham, WA | en_US |
dc.type.invited | no | en_US |
dc.relation.conferencename | Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II | en_US |
dc.relation.conferenceplace | Edinburgh, UK | en_US |
dc.relation.conferencedate | 26 June-1 July, 2016 | en_US |
dc.relation.scientificsector | FIS/05 - ASTRONOMIA E ASTROFISICA | en_US |
dc.type.miur | 273 Contributo in Atti di convegno | - |
dc.relation.series | PROCEEDINGS OF SPIE | en_US |
dc.identifier.adsbibcode | 2016SPIE.9912E..13S | en_US |
dc.description.apc | no | en_US |
dc.description.oa | 1 – prodotto con file in versione Open Access (allegare il file al passo 5-Carica) | en_US |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.openairetype | Conference paper | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | open | - |
item.fulltext | With Fulltext | - |
crisitem.author.dept | O.A. Brera | - |
crisitem.author.dept | IASF Palermo | - |
crisitem.author.dept | O.A. Brera | - |
crisitem.author.orcid | 0000-0002-8102-7349 | - |
crisitem.author.orcid | 0000-0003-4591-7763 | - |
crisitem.author.orcid | 0000-0003-3967-403X | - |
crisitem.journal.journalissn | 0277-786X | - |
crisitem.journal.ance | E136238 | - |
Appears in Collections: | 3.01 Contributi in Atti di convegno |
Files in This Item:
File | Description | Size | Format | |
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2016_991213.pdf | pdf editoriale | 5.81 MB | Adobe PDF | View/Open |
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