The particle background of the X-IFU instrument

Journal
Date Issued
2017
Author(s)
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Jacquey, Christian
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DOI
Abstract
In this paper we are going to review the latest estimates for the particle background expected on the X-IFU instrument onboard of the ATHENA mission. The particle background is induced by two different particle populations: the so called "soft protons" and the Cosmic rays. The first component is composed of low energy particles (< 100 s keV) that get funnelled by the mirrors towards the focal plane, losing part of their energy inside the filters and inducing background counts inside the instrument sensitivity band. The latter component is induced by high energy particles (> 100 MeV) that possess enough energy to cross the spacecraft and reach the detector from any direction, depositing a small fraction of their energy inside the instrument. Both these components are estimated using Monte Carlo simulations and the latest results are presented here.
Volume
44
Issue
3
Start page
371
Uri
Url
Issn Identifier
0922-6435
Ads BibCode
2017ExA....44..371L
Rights
open.access
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