Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/20.500.12386/29969
Titolo: | The particle background of the X-IFU instrument | Autori: | LOTTI, Simone MINEO, TERESA Jacquey, Christian MOLENDI, SILVANO D'ANDREA, MATTEO MACCULI, CLAUDIO PIRO, LUIGI |
Data pubblicazione: | 2017 | Rivista: | EXPERIMENTAL ASTRONOMY | Numero: | 44 | Fascicolo: | 3 | Da pagina:: | 371 | Abstract: | In this paper we are going to review the latest estimates for the particle background expected on the X-IFU instrument onboard of the ATHENA mission. The particle background is induced by two different particle populations: the so called "soft protons" and the Cosmic rays. The first component is composed of low energy particles (< 100 s keV) that get funnelled by the mirrors towards the focal plane, losing part of their energy inside the filters and inducing background counts inside the instrument sensitivity band. The latter component is induced by high energy particles (> 100 MeV) that possess enough energy to cross the spacecraft and reach the detector from any direction, depositing a small fraction of their energy inside the instrument. Both these components are estimated using Monte Carlo simulations and the latest results are presented here. | URI: | http://hdl.handle.net/20.500.12386/29969 | URL: | https://link.springer.com/article/10.1007%2Fs10686-017-9538-1 | ISSN: | 0922-6435 | DOI: | 10.1007/s10686-017-9538-1 | Bibcode ADS: | 2017ExA....44..371L | Fulltext: | open |
È visualizzato nelle collezioni: | 1.01 Articoli in rivista |
File in questo documento:
File | Descrizione | Dimensioni | Formato | |
---|---|---|---|---|
1705.04076.pdf | postprint | 1.63 MB | Adobe PDF | Visualizza/apri |
2017 - Exp Astron - Lotti et al.pdf | [Administrators only] | 2.06 MB | Adobe PDF |
Page view(s)
64
controllato il 19-apr-2024
Download(s)
37
controllato il 19-apr-2024
Google ScholarTM
Check
Altmetric
Altmetric
Tutti i documenti in DSpace sono pubblicati ad Accesso Aperto, salvo diversa indicazione per alcuni documenti specifici.