Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/20.500.12386/30886
Campo DC | Valore | Lingua |
---|---|---|
dc.contributor.author | Davide Marano | en_US |
dc.contributor.author | Giovanni Bonanno | en_US |
dc.contributor.author | Salvatore Garozzo | en_US |
dc.contributor.author | GRILLO, ALESSANDRO | en_US |
dc.contributor.author | Giuseppe Romeo | en_US |
dc.date.accessioned | 2021-04-23T14:22:39Z | - |
dc.date.available | 2021-04-23T14:22:39Z | - |
dc.date.issued | 2016 | en_US |
dc.identifier.issn | 1530-437X | en_US |
dc.identifier.uri | http://hdl.handle.net/20.500.12386/30886 | - |
dc.description.abstract | Silicon photomultipliers (SiPMs) are emerging semiconductor-based photosensors, addressing the challenge of low-light detection down to the single-photon counting level. A design of high-performance front-end electronics for SiPM readout requires the development of accurate electrical models. Numerous SiPM reliable models have matured in recent years; however, circuit parameter extraction is rather cumbersome and involves extensive measurement steps to be performed. Starting from a recently developed model of the SiPM device coupled to the conditioning electronics, a new effective analytical procedure is, here, devised for extracting the SiPM model parameters from experimental measurements. The proposed extraction technique is applied to a 3 × 3-mm 2 SiPM sensor, and is validated by comparing SPICE simulations and measurement results. Independent cross-check validation based on experimental tests corroborates the effectiveness of the adopted extraction procedure. | en_US |
dc.language.iso | eng | en_US |
dc.title | A New Simple and Effective Procedure for SiPM Electrical Parameter Extraction | en_US |
dc.type | Article | - |
dc.identifier.doi | 10.1109/jsen.2016.2530848 | en_US |
dc.identifier.scopus | 2-s2.0-84964381065 | en_US |
dc.identifier.url | https://ieeexplore.ieee.org/document/7409933 | en_US |
dc.relation.medium | STAMPA | en_US |
dc.type.referee | REF_1 | en_US |
dc.contributor.country | ITA | en_US |
dc.relation.scientificsector | FIS/05 - ASTRONOMIA E ASTROFISICA | en_US |
dc.relation.journal | IEEE SENSORS JOURNAL | en_US |
dc.type.miur | 262 Articolo in rivista | - |
dc.description.apc | no | en_US |
dc.description.oa | 1 – prodotto con file in versione Open Access (allegare il file al passo 5-Carica) | en_US |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.openairetype | Article | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | reserved | - |
item.fulltext | With Fulltext | - |
crisitem.author.dept | O.A. Catania | - |
crisitem.author.orcid | 0000-0003-4472-4978 | - |
crisitem.journal.journalissn | 1530-437X | - |
crisitem.journal.ance | E079886 | - |
È visualizzato nelle collezioni: | 1.01 Articoli in rivista |
File in questo documento:
File | Descrizione | Dimensioni | Formato | Existing users please |
---|---|---|---|---|
A New Simple and Effective Procedure for SiPM Electrical Parameter Extraction.pdf | [Administrators only] | 1.84 MB | Adobe PDF |
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