ROMEO, GiuseppeGiuseppeROMEO2018-12-292018-12-292015http://hdl.handle.net/20.500.12386/802ElettronicoenCharacterization test of SiPM FBK. Device: NUV low AP/CSPTechnical reporthttp://www.oact.inaf.it/weboac/Rapp_Int_Tec/Romeo_RIT_09_2015_GROMEO_Technical_Report_characterization_SiPM_FBK_NUV_LOW_AP.pdf