BILIOTTI, ValdemaroValdemaroBILIOTTIGennari, SandroSandroGennari2018-12-292018-12-292004http://hdl.handle.net/20.500.12386/921ElettronicoitCaratterizzazione di FET a temperature criogenicheTechnical reporthttps://193.206.154.33/images/data/Reports/04/giano_fet.pdf