SPIGA, DanieleDanieleSPIGADe Lorenzi SimoneTordi MassimilianoMORETTI, AlbertoAlbertoMORETTISIRONI, GIORGIAGIORGIASIRONIBASSO, StefanoStefanoBASSO2023-02-222023-02-222021http://hdl.handle.net/20.500.12386/33737In this document the VERT-X critical item test plan is presented at the concept level, together with the ground segment necessary for the implementation. While the raster scan is test in air in ad-hoc clean room, the X-ray source system is tested separately with X-ray in vacuum . This document has been delivered at the Design Review of the "Demonstration of the VERT-X critical items" project.ELETTRONICOenResearch reportFIS/05 - ASTRONOMIA E ASTROFISICAERC sectors::Physical Sciences and Engineering