X-ray optics with slumped glasses: High-resolution metrology with CUP of AF32 slumped glasses

CIVITANI, Marta MariaMarta MariaCIVITANISALMASO, BiancaBiancaSALMASOPROSERPIO, LauraLauraPROSERPIOPARESCHI, GiovanniGiovanniPARESCHI2019-04-152019-04-152015http://hdl.handle.net/20.500.12386/2175ElettronicoenX-ray optics with slumped glasses: High-resolution metrology with CUP of AF32 slumped glassesTechnical report