Silicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterization

SPIGA, DanieleDanieleSPIGASIRONI, GIORGIAGIORGIASIRONICOTRONEO, VINCENZOVINCENZOCOTRONEOCANESTRARI, RodolfoRodolfoCANESTRARIDestefanis, G.G.Destefanis2019-04-152019-04-152008http://hdl.handle.net/20.500.12386/2103ElettronicoenSilicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterizationTechnical report