ROMEO, GiuseppeGiuseppeROMEOBONANNO, GiovanniGiovanniBONANNO2018-12-292018-12-292013http://hdl.handle.net/20.500.12386/784ElettronicoenElectro-Optical Characterization Report. Device: SiPM MPPC HAMAMATSU S/N. A0007 100 µmTechnical reporthttp://www.oact.inaf.it/weboac/Rapp_Int_Tec/Romeo_RIT_16__2013_GROMEO_Technical_Report_Chatacterization_SiPM_Hamamatsu_S_N_A007_100um.pdf