Reflectivity and stress characterization of W/Si and Pt/C multilayer samples for the New Hard X-ray Mission phase B development

SPIGA, DanieleDanieleSPIGARaimondi, L.L.RaimondiSALMASO, BiancaBiancaSALMASONegri, R.R.Negri2019-04-152019-04-152010http://hdl.handle.net/20.500.12386/2119ElettronicoenReflectivity and stress characterization of W/Si and Pt/C multilayer samples for the New Hard X-ray Mission phase B developmentTechnical report