Gillard, WilliamWilliamGillardBenielli, DominiqueDominiqueBenielliClemens, Jean-ClaudeJean-ClaudeClemensDusini, StefanoStefanoDusiniFRANCESCHI, ENRICOENRICOFRANCESCHIMaciaszek, ThierryThierryMaciaszekMEDINACELI VILLEGAS, EduardoEduardoMEDINACELI VILLEGASSIRIGNANO, CHIARACHIARASIRIGNANOTroja, AntoninoAntoninoTrojaSorensen, AntonAntonSorensenZoubian, JulienJulienZoubian2024-01-232024-01-232021http://hdl.handle.net/20.500.12386/34592During the Euclid PLM test campaign, it was the first time that the NISP, VIS and FGS instruments were operating together. In order to verify auto-compatibility between those instruments, dedicated test have be conducted during the PLM test campaign. One aspect addressed during the instrument auto-compatibility tests was to evaluate either the VIS-RSU or VIS-CU could be operated during NISP exposure without impacting on the NISP data quality. This technical note presents an annalyse on the data quality of the NISP instrument obtained during NISP & VIS-RSU auto-compatibility test (NISP-04-4) and NISP & VIS-CU auto-compatibility test (NISP-08-2) (see AD0).ELETTRONICOenResearch reportFIS/05 - ASTRONOMIA E ASTROFISICAERC sectors::Physical Sciences and Engineering::PE8 Products and Processes Engineering: Product design, process design and control, construction methods, civil engineering, energy systems, material engineering