Results of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfA

SPIGA, DanieleDanieleSPIGACANESTRARI, RodolfoRodolfoCANESTRARIPARESCHI, GiovanniGiovanniPARESCHIBASSO, StefanoStefanoBASSOBruni, R.R.BruniBudau, B.B.BudauBurkert, W.W.BurkertColombo, D.D.ColomboDestefanis, G.G.DestefanisFreyberg, M.M.FreybergGorenstein, P.P.GorensteinGubarev, M.M.GubarevHartner, G.G.HartnerMazzoleni, FrancescoFrancescoMazzoleniRamsey, B.B.RamseyRomaine, S.S.RomaineVALTOLINA, RENZORENZOVALTOLINA2019-04-152019-04-152007http://hdl.handle.net/20.500.12386/2099ElettronicoenResults of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfATechnical report