Electro-Optical Characterization Report. Device: SiPM MPPC HAMAMATSU S/N. 1 50 µm

ROMEO, GiuseppeGiuseppeROMEOBONANNO, GiovanniGiovanniBONANNO2018-12-292018-12-292013http://hdl.handle.net/20.500.12386/785ElettronicoenElectro-Optical Characterization Report. Device: SiPM MPPC HAMAMATSU S/N. 1 50 µmTechnical reporthttp://www.oact.inaf.it/weboac/Rapp_Int_Tec/Romeo_RIT_17__2013_GROMEO_Technical_Report_Chatacterization_SiPM_Hamamatsu_S_N.1.pdf