SIRIGNANO, CHIARACHIARASIRIGNANOTroja, AntoninoAntoninoTrojaGillard, WilliamWilliamGillardAnselmi, StefanoStefanoAnselmiAURICCHIO, NATALIANATALIAAURICCHIOBALESTRA, AndreaAndreaBALESTRABATTAGLIA, Paola MariaPaola MariaBATTAGLIABenielli, DominqueDominqueBenielliBONINO, DonataDonataBONINOBorsato, EnricoEnricoBorsatoCapobianco, VitoVitoCapobiancoCORCIONE, LeonardoLeonardoCORCIONEClemens, Jean-ClaudeJean-ClaudeClemensDE CARO, BiancaBiancaDE CARODusini, StefanoStefanoDusiniFRANCESCHI, ENRICOENRICOFRANCESCHIGiacomini, FrancescoFrancescoGiacominiGabarra, Louis Pierre MarieLouis Pierre MarieGabarraLIGORI, SebastianoSebastianoLIGORIMEDINACELI VILLEGAS, EduardoEduardoMEDINACELI VILLEGASRenzi, AlessandroAlessandroRenziSirri, GabrieleGabrieleSirriStanco, LucaLucaStancoTRIFOGLIO, MASSIMOMASSIMOTRIFOGLIOVALENZIANO, LucaLucaVALENZIANOVerza, GiovanniGiovanniVerza2024-01-232024-01-232021http://hdl.handle.net/20.500.12386/34593This document describes analysis of the Dark Exposures performed during the PLM test campaign. The test was conducted at CSL facility by ADS during May, June and July 2021ELETTRONICOenResearch reportFIS/05 - ASTRONOMIA E ASTROFISICAERC sectors::Physical Sciences and Engineering::PE8 Products and Processes Engineering: Product design, process design and control, construction methods, civil engineering, energy systems, material engineering