X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005

SPIGA, DanieleDanieleSPIGABurkert, W.W.BurkertHartner, G.G.HartnerBudau, B.B.BudauVernani, D.D.VernaniCANESTRARI, RodolfoRodolfoCANESTRARIPARESCHI, GiovanniGiovanniPARESCHICitterio, ObertoObertoCitterioBASSO, StefanoStefanoBASSOMazzoleni, FrancescoFrancescoMazzoleniVALTOLINA, RENZORENZOVALTOLINA2019-04-152019-04-152005http://hdl.handle.net/20.500.12386/2089ElettronicoenX-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005Technical report