SPIGA, DanieleDanieleSPIGARaimondi, L.L.RaimondiSALMASO, BiancaBiancaSALMASOCIVITANI, Marta MariaMarta MariaCIVITANIPagano, G.G.PaganoBASSO, StefanoStefanoBASSOGHIGO, MauroMauroGHIGOPROSERPIO, LauraLauraPROSERPIO2019-04-152019-04-152011http://hdl.handle.net/20.500.12386/2125ElettronicoenHigh-resolution X-ray scattering measurement of slumped glassesTechnical report