CANESTRARI, RodolfoRodolfoCANESTRARISPIGA, DanieleDanieleSPIGAPARESCHI, GiovanniGiovanniPARESCHIGhigo, MauriMauriGhigoArumainathan, S.S.ArumainathanDestefanis, G.G.DestefanisFabbri, P.P.FabbriFerrari, C.C.FerrariGuaita, C.C.GuaitaNicolosi, P.P.NicolosiSalviati, G.G.Salviati2019-04-152019-04-152007http://hdl.handle.net/20.500.12386/2100ElettronicoenSurface roughness and bulk characterization of SiC and Aluminium samples with PECVD-SiC claddingTechnical report