ROMEO, GiuseppeGiuseppeROMEO2018-12-292018-12-292015http://hdl.handle.net/20.500.12386/804ElettronicoenCharacterization test of SiPM SensL. Device: J-SeriesTechnical reporthttp://www.oact.inaf.it/weboac/Rapp_Int_Tec/Romeo_RIT_11_2015_GROMEO_Technical_Report_characterization_SiPM_SensL-JSeries.pdf