SPIGA, DanieleDanieleSPIGAPROSERPIO, LauraLauraPROSERPIOSALMASO, BiancaBiancaSALMASOGHIGO, MauroMauroGHIGOFriedrich, P.P.FriedrichVongehr, M.M.VongehrWinter, A.A.WinterBASSO, StefanoStefanoBASSOCIVITANI, Marta MariaMarta MariaCIVITANIGallieni, D.D.GallieniTintori, M.M.TintoriSIRONI, GIORGIAGIORGIASIRONIPagano, G.G.PaganoNegri, R.R.NegriRossi, MassimilianoMassimilianoRossiAlpini, A.A.AlpiniCavenaghi, T.T.CavenaghiZambra, A.A.ZambraFerrario, I.I.FerrarioPARESCHI, GiovanniGiovanniPARESCHICitterio, ObertoObertoCitterioTAGLIAFERRI, GianpieroGianpieroTAGLIAFERRI2019-04-152019-04-152013http://hdl.handle.net/20.500.12386/2147ElettronicoenProfile and roughness metrology of slumped glasses for the "IXO back-up optics" projectTechnical report