CIVITANI, Marta MariaMarta MariaCIVITANIHOLYSZKO, JOANNAJOANNAHOLYSZKO2024-06-262024-06-262018http://hdl.handle.net/20.500.12386/35260The scope of the document is report the tests performed to characterize the polishing process by means of 3M™ Trizact™ Hookit™ Film Disc 568XA and 3M™ Trizact™ Hookit™ Film Disc 268XA. The tests were part of the optimization of the polishing process, to increase the speed and to reduce the costs of shell production]. They were carried out on fused silica samples prepared with a starting micro-roughness of the order of 50 - 70 nm rms (equivalent to the initial status of the shell under manufacturing). We characterized the removal rate and the micro-roughness improvement rate in dependence of several parameters as amount of water, pH, velocity and pressure, taking care also of the wear rate of the pads.ELETTRONICOenGlass Technology for the next generation X-ray optics: Report on polishing testsResearch reportFIS/05 - ASTRONOMIA E ASTROFISICA