Monnier, JohnJohnMonnierRau, GioiaGioiaRauBaines, Ellyn K.Ellyn K.BainesSanchez-Bermudez, JoelJoelSanchez-BermudezElvis, MartinMartinElvisRagland, SamSamRaglandAkeson, RachelRachelAkesonvan Belle, GerardGerardvan BelleNorris, RyanRyanNorrisGordon, KathrynKathrynGordonDefrère, DenisDenisDefrèreRidgway, StephenStephenRidgwayLe Bouquin, Jean-BaptisteJean-BaptisteLe BouquinAnugu, NarsireddyNarsireddyAnuguScott, NicholasNicholasScottKane, StephenStephenKaneRichardson, NoelNoelRichardsonRegaly, ZsoltZsoltRegalyZhu, ZhaohuanZhaohuanZhuChiavassa, AndreaAndreaChiavassaVasisht, GautamGautamVasishtStassun, Keivan G.Keivan G.StassunDong, ChuanfeiChuanfeiDongAbsil, OlivierOlivierAbsilLacour, SylvestreSylvestreLacourWeigelt, GerdGerdWeigeltGies, DouglasDouglasGiesAdams, Fred C.Fred C.AdamsCalvet, NuriaNuriaCalvetQuanz, Sascha P.Sascha P.QuanzEspaillat, CatherineCatherineEspaillatGardner, TylerTylerGardnerGreenbaum, AlexandraAlexandraGreenbaumMillan-Gabet, RafaelRafaelMillan-GabetPackham, ChrisChrisPackhamGAI, MarioMarioGAIKral, QuentinQuentinKralBerger, Jean-PhilippeJean-PhilippeBergerLinz, HendrikHendrikLinzKlarmann, LuciaLuciaKlarmannBae, JaehanJaehanBaeLopez Garcia, RebecaRebecaLopez GarciaAlexandre, GallenneGallenneAlexandreBaron, FabienFabienBaronHartmann, LeeLeeHartmannKishimoto, MakotoMakotoKishimotoMcClure, MelissaMelissaMcClureOlofsson, JohanJohanOlofssonHaniff, ChrisChrisHaniffLine, MichaelMichaelLinePetrov, Romain G.Romain G.PetrovSmith, MichaelMichaelSmithHummel, ChristianChristianHummelten Brummelaar, TheoTheoten BrummelaarDe Furio, MatthewMatthewDe FurioRinehart, StephenStephenRinehartLeisawitz, DavidDavidLeisawitzDanchi, WilliamWilliamDanchiHuber, DanielDanielHuberWishnow, EdwardEdwardWishnowMourard, DenisDenisMourardPope, BenjaminBenjaminPopeIreland, MichaelMichaelIrelandKraus, StefanStefanKrausSetterholm, BenjaminBenjaminSetterholmWhite, RusselRusselWhite2020-12-182020-12-1820192330-9458http://hdl.handle.net/20.500.12386/29006Diffraction fundamentally limits our ability to image and characterize exoplanets. Interferometry offers some advantages in exoplanet detection and characterization and we explore in this white paper some of the potential scientific breakthroughs possible.ELETTRONICOenArticlehttps://baas.aas.org/pub/2020n3i514/release/12019BAAS...51c.514MFIS/05 - ASTRONOMIA E ASTROFISICA