CANESTRARI, RodolfoRodolfoCANESTRARIVALTOLINA, RENZORENZOVALTOLINASPIGA, DanieleDanieleSPIGAPARESCHI, GiovanniGiovanniPARESCHI2019-04-152019-04-152006http://hdl.handle.net/20.500.12386/2093ElettronicoenCharacterization of a PECVD-SiC replicated mirror sampleTechnical report