Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization

Tayabaly, K.K.TayabalySPIGA, DanieleDanieleSPIGASALMASO, BiancaBiancaSALMASOValsecchi, GiuseppeGiuseppeValsecchiBanham, R.R.BanhamMissaglia, N.N.MissagliaPARESCHI, GiovanniGiovanniPARESCHITAGLIAFERRI, GianpieroGianpieroTAGLIAFERRI2019-04-152019-04-152014http://hdl.handle.net/20.500.12386/2152ElettronicoenElectroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterizationTechnical reporthttps://tinyurl.com/oab-tr05-2014