ROMEO, GiuseppeGiuseppeROMEOBONANNO, GiovanniGiovanniBONANNO2018-12-292018-12-292013http://hdl.handle.net/20.500.12386/782ElettronicoenElectro-Optical Characterization Report. Device: SiPM EXCELITAS - S/N. D3932Technical reporthttp://www.oact.inaf.it/weboac/Rapp_Int_Tec/Romeo_RIT_14__2013_GROMEO_Technical_Report_Chatacterization_SiPM_Excelitas_C30742_33_050C_D3932.pdf