SPIGA, DanieleDanieleSPIGAPARESCHI, GiovanniGiovanniPARESCHI2019-04-152019-04-152006http://hdl.handle.net/20.500.12386/2092ElettronicoenOptic (HXT 150 + 230)test at Panter facility: Preliminary Performances Evaluation and Proposed Test Plan definitionTechnical report