Journal OAB Technical Reports
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Issue Date | Title | Author(s) | Fulltext | |
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1 | 2012 | AFM analysis of test wafers coated with Cr-Ni-Au layers: roughness characterization | SALMASO, Bianca ; SPIGA, Daniele | none |
2 | 2012 | IXO back-up optics with slumped glasses: Proof of Concept (PoC) tests at PANTER and INAF/OAB | SPIGA, Daniele ; SALMASO, Bianca ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; SIRONI, GIORGIA ; Pagano, G.; Zambra, A.; Burwitz, Vadim | none |
3 | 2012 | IXO back-up optics with slumped glasses: XOU-BB tests at PANTER and INAF/OAB | SPIGA, Daniele ; CIVITANI, Marta Maria ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; SALMASO, Bianca ; PARESCHI, Giovanni ; Zambra, A.; Pagano, G.; Burwitz, Vadim; Menz, B.; Hartner, G.; Budau, B.; Friedrich, P.; Winter, A. | none |
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