Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/2129| Title: | AFM analysis of test wafers coated with Cr-Ni-Au layers: roughness characterization | Authors: | SALMASO, Bianca SPIGA, Daniele |
Issue Date: | 2012 | Series: | OAB Technical Reports | Number: | 01/2012 | URI: | http://hdl.handle.net/20.500.12386/2129 | Fulltext: | none |
| Appears in Collections: | 4.02 Rapporti tecnici pregressi |
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