| Issue Date | Title | Author(s) | Fulltext |
1 | 2016 | 2D diffraction simulations of a 12 m focal length SPO mirror module for ATHENA | SPIGA, Daniele ; Valsecchi, Giuseppe; Marioni, F.; Bianucci, G.; Bavdaz, M.; Wille, E. | none |
2 | 2015 | Acceptance tests and calibration of the Explorer Atomic Force Microscope new head | SALMASO, Bianca ; SPIGA, Daniele | none |
3 | 2016 | Acceptance tests for the MicroFinish Topographer | Tayabaly, K.; Rossi, Massimiliano; Scaccabarozzi, L.; SPIGA, Daniele | none |
4 | 2012 | AFM analysis of test wafers coated with Cr-Ni-Au layers: roughness characterization | SALMASO, Bianca ; SPIGA, Daniele | none |
5 | 2017 | BEaTriX X-ray facility for testing ATHENA mirror modules: a white paper for the implementation | SPIGA, Daniele ; PARESCHI, Giovanni ; SALMASO, Bianca ; TAGLIAFERRI, Gianpiero | none |
6 | 2018 | BEaTriX: vibrations campaign on the laboratory ground | SALMASO, Bianca ; SPIGA, Daniele ; BASSO, Stefano ; GIRO, Enrico ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
7 | 2008 | Calibration of SIMBOL-X optics at PANTER facility: proposed setup and hardware implementation | SPIGA, Daniele ; BASSO, Stefano ; PARESCHI, Giovanni ; Malaguti, P.; Freyberg, M.; Briel, U. | none |
8 | 2009 | Calibration of very long (>10 m) focal length X-ray optics at PANTER facility: a short update | SPIGA, Daniele | none |
9 | 2009 | Calibration of W/Si multilayer samples for SIMBOL-X X-ray telescope Phase A development | SPIGA, Daniele ; PROSERPIO, Laura; CIVITANI, Marta Maria ; Dell’Orto, E.; SIRONI, GIORGIA ; COTRONEO, VINCENZO ; Mattarello, V.; Garoli, D.; Boscolo Marchi, E. | none |
10 | 2006 | Characterization of a PECVD-SiC replicated mirror sample | CANESTRARI, Rodolfo ; VALTOLINA, RENZO; SPIGA, Daniele ; PARESCHI, Giovanni | none |
11 | 2005 | Characterization of a W/Si graded multilayer coated mirror shell (n. 326) preformed by Nickel electroforming (april 2004) | SPIGA, Daniele | none |
12 | 2006 | Characterization of an antenna for RFID systems | CANESTRARI, Rodolfo ; PARESCHI, Giovanni | none |
13 | 2005 | Characterization of Pt/C and W/Si multilayer-coated mirror shells at the PANTER facility (Sep 2004 - Feb 2005) | SPIGA, Daniele | none |
14 | 2011 | Characterization of slumped glasses for the IXO backup optics project, phase 2 | SPIGA, Daniele ; PROSERPIO, Laura; Pagano, Giuseppe; SALMASO, Bianca | none |
15 | 2015 | Characterization of the profiles of slumped glass foils after cutting and annealing | HOLYSZKO, JOANNA; SALMASO, Bianca ; CIVITANI, Marta Maria | none |
16 | 2014 | Characterization of the Silicon cylindrical slumping mould polished by HELLMA | SALMASO, Bianca ; Brizzolari, C.; CIVITANI, Marta Maria ; SPIGA, Daniele | none |
17 | 2014 | Characterization of the Zerodur K20-20 cylindrical slumping mould polished by HELLMA | SALMASO, Bianca ; Brizzolari, C.; SPIGA, Daniele ; Rossi, Massimiliano; Arcangeli, L. | none |
18 | 2015 | Characterization of the Zerodur K20-20B cylindrical slumping mould polished by HELLMA | SALMASO, Bianca ; Brizzolari, C.; Arcangeli, L.; Rossi, Massimiliano; SPIGA, Daniele | none |
19 | 2014 | Characterization Universal Profilometer (CUP): carriages systematic error removal | CIVITANI, Marta Maria ; GHIGO, Mauro | none |
20 | 2014 | Characterization Universal Profilometer (CUP): NewPort carriage characterization | CIVITANI, Marta Maria ; GHIGO, Mauro | none |