PARESCHI, Giovanni
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Results 21-30 of 30 (Search time: 0.005 seconds).
Issue Date | Title | Author(s) | Fulltext | |
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21 | 2018 | A novel approach for the realization of thin glass substrates for optical mirrors | VECCHI, Gabriele ; BASSO, Stefano ; CANESTRARI, Rodolfo ; CIVITANI, Marta Maria ; GHIGO, Mauro ; Hołyszko, J.; PARESCHI, Giovanni ; SALMASO, Bianca | open |
22 | 2016 | Point spread function computation in normal incidence for rough optical surfaces | Tayabaly, Kashmira; SPIGA, Daniele ; SIRONI, GIORGIA ; CANESTRARI, Rodolfo ; Lavagna, Michele; PARESCHI, Giovanni | open |
23 | 2016 | Qualification and Testing of a Large Hot Slumped Secondary Mirror for Schwarzschild-Couder Imaging Air Cherenkov Telescopes | Rodeghiero, G.; GIRO, Enrico ; CANESTRARI, Rodolfo ; PERNECHELE, Claudio ; SIRONI, GIORGIA ; PARESCHI, Giovanni ; LESSIO, Luigi ; Conconi, P. | open |
24 | 2007 | Results of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfA | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Budau, B.; Burkert, W.; Colombo, D.; Destefanis, G.; Freyberg, M.; Gorenstein, P.; Gubarev, M.; Hartner, G.; Mazzoleni, Francesco; Ramsey, B.; Romaine, S.; VALTOLINA, RENZO | none |
25 | 2015 | Roughness tolerances for Cherenkov telescope mirrors | Tayabaly, K.; SPIGA, Daniele ; CANESTRARI, Rodolfo ; Bonnoli, G.; Lavagna, M.; PARESCHI, Giovanni | open |
26 | 2007 | Surface roughness and bulk characterization of SiC and Aluminium samples with PECVD-SiC cladding | CANESTRARI, Rodolfo ; SPIGA, Daniele ; PARESCHI, Giovanni ; Ghigo, Mauri; Arumainathan, S.; Destefanis, G.; Fabbri, P.; Ferrari, C.; Guaita, C.; Nicolosi, P.; Salviati, G. | none |
27 | 2021 | Technical and scientific performance of the prototype Schwarzschild-Couder telescope for CTA | Adams, C. B.; Ambrosi, G.; Ambrosio, M.; Aramo, C.; Batista, P. I.; Benbow, W.; Bertucci, B.; Bissaldi, E.; Bitossi, M.; Boiano, A.; Bonavolontà, C.; Bose, R.; Brill, A.; Brown, A. M.; Buckley, J. H.; CANESTRARI, Rodolfo ; Capasso, M.; Caprai, M.; Covault, C. E.; De Paoli, D.; Di Venere, L.; Errando, M.; Fegan, S.; Feng, Q.; Fiandrini, E.; Furniss, A.; Gent, A.; Giglietto, N.; Giordano, F.; GIRO, Enrico ; Halliday, R.; Hervet, O.; Holder, J.; Humensky, T. B.; Incardona, S.; Ionica, M.; Jin, W.; Kieda, D. B.; Licciulli, F.; Loporchio, S.; Marsella, G.; Masone, V.; Meagher, K.; Meures, T.; Mode, B. A. W.; Mognet, S. A. I.; Mukherjee, R.; Nieto, D.; Okumura, A.; Otte, N.; Pantaleo, F. R.; Paoletti, R.; PARESCHI, Giovanni ; Di Pierro, F.; Pueschel, E.; Ribeiro, D.; Riitano, L.; Roache, E.; Ross, D.; Rousselle, J.; Rugliancich, A.; Santander, M.; Shang, R.; Stiaccini, L.; Tajima, H.; Taylor, L. P.; Tosti, L.; Tovmassian, G.; Tripodo, G.; Vagelli, V.; Valentino, M.; Vanderbrouke, J. J.; Vassiliev, V. V.; Watson, J. J.; White, R.; Williams, D. A.; Yu, P.; Zink, A. | open |
28 | 2005 | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | SPIGA, Daniele ; Burkert, W.; Hartner, G.; Budau, B.; Vernani, D.; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco; VALTOLINA, RENZO | none |
29 | 2007 | X-ray optic 346 manufactured at MSFC and Harvard-CfA: results of tests at PANTER facility and surface characterization | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Burkert, W.; Budau, B.; Freyberg, M.; Gorenstein, P.; Hartner, G.; Mazzoleni, Francesco | none |
30 | 2009 | X-ray tests at PANTER on Nickel-Cobalt EM#3 (phase A) SIMBOL-X optic prototype | SPIGA, Daniele ; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; Mattarello, V.; Garoli, D.; Boscolo Marchi, E.; BASSO, Stefano ; Valtolina,Renzo; Mattaini,Enrico; CANESTRARI, Rodolfo ; Garegnani, Donato; TAGLIAFERRI, Gianpiero ; PARESCHI, Giovanni ; MORETTI, Alberto | none |
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