SALMASO, Bianca
Series
Results 1-2 of 2 (Search time: 0.002 seconds).
Issue Date | Title | Author(s) | Fulltext | |
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1 | 2014 | Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization | Tayabaly, K.; SPIGA, Daniele ; SALMASO, Bianca ; Valsecchi, Giuseppe; Banham, R.; Missaglia, N.; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
2 | 2014 | Proof of Concept No. 2 optic with slumped glasses: tests in focus at PANTER | SPIGA, Daniele ; CIVITANI, Marta Maria ; Burwitz, Vadim; Burkert, W.; Menz, B.; Hartner, G.; SALMASO, Bianca ; BASSO, Stefano ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; GHIGO, Mauro | none |
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