Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/2152| Title: | Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization | Authors: | Tayabaly, K. SPIGA, Daniele SALMASO, Bianca Valsecchi, Giuseppe Banham, R. Missaglia, N. PARESCHI, Giovanni TAGLIAFERRI, Gianpiero |
Issue Date: | 2014 | Series: | OAB Technical Reports | Number: | 05/2014 | URI: | http://hdl.handle.net/20.500.12386/2152 | URL: | https://tinyurl.com/oab-tr05-2014 | Fulltext: | none |
| Appears in Collections: | 4.02 Rapporti tecnici pregressi |
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