PICsIT and IBIS test equipments design concept

Date Issued

1997

Author(s)

TRIFOGLIO, MASSIMO

•

STEPHEN, JOHN BUCHAN

•

GIANOTTI, FULVIO

Series

OAS Technical Reports

Volume

CNR TESRE 202

Uri

http://hdl.handle.net/20.500.12386/1579

Rights

metadata.only