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  5. Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors
 

Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors

Date Issued
2016
Author(s)
SCIORTINO, LUISA  
•
LO CICERO, UGO  
•
Magnano, Elena
•
Píš, Igor
•
Barbera, Marco  
DOI
10.1117/12.2232376
Abstract
The ATHENA mission provides the demanded capabilities to address the ESA science theme "Hot and Energetic Universe". Two complementary instruments are foreseen: the X-IFU (X-ray Integral Field Unit) and WFI (Wide Field Imager). Both the instruments require filters to avoid that the IR radiation heats the X-IFU cryogenic detector and to protect the WFI detector from UV photons. Previous experience on XMM filters recommends to employ bilayer membrane consisting of aluminum deposited on polyimide. In this work, we use the X-ray Photoelectron Spectroscopy (XPS) to quantify the native aluminum oxide thickness that affects the spectral properties of the filter. The estimation of the oxide thickness of the prototype filter for ATHENA is a considerable information for the conceptual design of the filters.
Coverage
Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
All editors
den Herder, Jan-Willem A.; Takahashi, Tadayuki; Bautz, Marshall
Series
PROCEEDINGS OF SPIE  
Volume
9905
Start page
990566
Conferenece
Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
Conferenece place
Edinburgh, United Kingdom
Conferenece date
26 June - 1 July 2016
Uri
http://hdl.handle.net/20.500.12386/26137
Url
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9905/1/Surface-investigation-and-aluminum-oxide-estimation-on-test-filters-for/10.1117/12.2232376.short?SSO=1
Issn Identifier
0277-786X
Ads BibCode
2016SPIE.9905E..66S
Rights
open.access
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2016 Sciortino - Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors.pdf

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