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PRODOTTI RICERCA INAF
4 ALTRI PRODOTTI SCIENTIFICI (Other scientific products)
4.02 Rapporti tecnici pregressi
Silicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterization
Silicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterization
Date Issued
2008
Author(s)
SPIGA, Daniele
•
SIRONI, GIORGIA
•
COTRONEO, VINCENZO
•
CANESTRARI, Rodolfo
•
Destefanis, G.
Series
OAB Technical Reports
Volume
01/2008
Uri
http://hdl.handle.net/20.500.12386/2103
Rights
metadata.only
