Quick Look Data Analysis Of LFI Spike Tests during EMC tests
Date Issued
2008
Author(s)
Abstract
This document has been issued in the frame of ASI contract that has been released
for the activities of Planck-LFI Phase E2
2.1 Purpose and Scope
Scope of this document is to give a first quick look analysis response of Spike test
requested by LFI IOT at system level. Being the tests foreseen to be performed in
two slots during the night shift in the middle of EMC/Autocompatibility tests the
document is divided in two sets.
Each set is dedicated to a single shift and it is divided in two different sections. The
first section is related to the description of the work done that is to say the
description of the LFI Log Book and the description of the performed tests. The
second section is the summary of the results of each test coming from both real
time and offline data analysis.
Volume
PL-LFI-PST-RP-031
Rights
open.access
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ESA-44.pdf
Size
420.34 KB
Format
Adobe PDF
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