ATTENZIONE! IL REPOSITORY E’ APERTO ESCLUSIVAMENTE ALL’IMMISSIONE DEI RAPPORTI TECNICI (COLLEZIONE 4.01). NON E’ POSSIBILE INSERIRE PRODOTTI IN TUTTE LE ALTRE COLLEZIONI, A CAUSA DI PROBLEMI TECNICI. THE REPOSITORY IS OPEN EXCLUSIVELY FOR THE SUBMISSION OF TECHNICAL REPORTS (COLLECTION 4.01). SUBMISSIONS TO ALL OTHER COLLECTIONS ARE TEMPORARILY UNAVAILABLE, DUE TO TECHNICAL ISSUES.
 

The X-Gamma Imaging Spectrometer (XGIS) onboard THESEUS

Journal
Date Issued
2018
Author(s)
•
•
•
•
•
•
Frontera, F.
•
Baldazzi, G.
•
Bellutti, P.
•
Borghi, G.
•
Elmi, I.
•
•
•
Ficorella, F.
•
•
Picciotto, A.
•
•
Rachevski, A.
•
•
Vacchi, A.
•
Zampa, G.
•
Zampa, N.
•
Zorzi, N.
Abstract
A compact and modular X and gamma-ray imaging spectrometer (XGIS) has been designed as one of the instruments foreseen onboard the THESEUS mission proposed in response to the ESA M5 call. The experiment envisages the use of CsI scintillator bars read out at both ends by single-cell 25 mm2 Silicon Drift Detectors. Events absorbed in the Silicon layer (lower energy X rays) and events absorbed in the scintillator crystal (higher energy X rays and gamma -rays) are discriminated using the on-board electronics. A coded mask provides imaging capabilities at low energies, thus allowing a compact and sensitive instrument in a wide energy band (∼2 keV up to ∼20 MeV). The instrument design, expected performance and the characterization performed on a series of laboratory prototypes are discussed.
Volume
89
Issue
2
Start page
137
Uri
Url
Issn Identifier
0037-8720
Ads BibCode
2018MmSAI..89..137C
Rights
open.access
File(s)
Loading...
Thumbnail Image
Name

1802.01674.pdf

Description
postprint
Size

1.93 MB

Format

Adobe PDF

Checksum (MD5)

98c3bd04380a6f88dd6146af011e784f

Loading...
Thumbnail Image
Name

46_Campana_et_al_2018.pdf

Description
Pdf editoriale
Size

845.86 KB

Format

Adobe PDF

Checksum (MD5)

b797bc618c85f298ddff8aa03f743282