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X-IFU Thermal Filter THF300 thermalization study

Date Issued
2023
Author(s)
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Abstract
This document reports a parametric thermal study performed on different technical solutions to heat the X-IFU thermal filter TH300 to minimize molecular contamination during the lifetime of the mission. The thermal model retrieves the radial temperature profile on the THF300 filter of the X-IFU instrument and establishes the necessary conditions to keep all the filter area above the temperature of 320 K [AD1]. The outcomes of this study have guided the choice of the baseline heating strategy compliant with the stringent thermal specifications of the X-IFU instrument, the selection of the filter mesh and plating materials, and the required operating temperature of the 300 K carrier.
Volume
XIFU-UNPA-THF-RP-0004-i01-r00
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Rights
restricted
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XIFU-UNPA-THF-RP-0004-i01-r00_X-IFU Thermal Filter THF300 thermalization study_spli01.pdf

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[Administrators only] part 1/2
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4.63 MB

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XIFU-UNPA-THF-RP-0004-i01-r00_X-IFU Thermal Filter THF300 thermalization study_spli02.pdf

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[Administrators only] Part 2/2
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6.54 MB

Format

Adobe PDF

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